Document Details
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Document Type |
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Thesis |
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Document Title |
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SPECTROSCOPIC ANALYSIS USING ELLIPSOMETRY FOR DOPED - CU AND NI OXIDE FILMS GROWN VIA MAGNETRON SPUTTERING TECHNIQUE التحليل الطيفي باستخدام تقنية الاستقطاب القطاعي لأفلام اكسيد النحاس والنيكل المطعمة والمترسبة باستخدام تقنية النثر المغنطي |
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Subject |
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Faculty of Science |
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Document Language |
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Arabic |
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Abstract |
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Among countless applications of NiO thin films, transparent electrochromic p-type smart windows are of particular interest. Additionally, the applications such as active optical filters, transparent conducting electrodes, and automotive rearview mirrors with adjustable reflectance encouraged tuning the optoelectronic properties of the NiO thin films to fit the increasing modern life's needs. Likewise, CuO nanostructured thin films have gained increasing interest due to their unique properties. Incorporating a metallic dopant into the CuO thin film can alter such properties to improve or control optoelectronic applications, such as solar energy transformation, photoconductivity, and infrared filters.
This thesis targeted the synthesization of Al/Nb-doped NiO and Ti/Sm-doped CuO nanostructured thin films. Among available deposition techniques, DC and RF magnetron sputtering were chosen. Thin films of a maximum thickness of 70 nm were deposited on glass and silicon substrates. A range of deposition powers between 30 W to 60 W was applied to the metallic target to control the amount of the deposited metal into the host material. The dopants did not change the crystalline phase of the host material; they shifted the diffraction angle instead. That shift was consistent with the deposition power.
Doping NiO with Nb showed advantages over Al-doped NiO thin films, represented by a higher refractive index, narrower bandgap, lower resistivity, and lower emission intensity. The improved optical properties supported the targeted applications of the NiO nanostructured thin films.
Doping CuO by Sm elevated the refractive index of the undoped CuO. This increase in the refractive index supports the needs of the targeted applications. Additionally, the XRD and PL studies were consistent and succeeded in explaining the bandgap structure of the Sm-doped CuO. Despite their large ionic radii, Sm ions, at the underlying deposition powers, managed to occupy some of the Cu ions' sites in the unit cell, leading to the improvement of Sm-doped CuO properties required for the targeted applications. On the other hand, Ti-doped CuO did not show promising results as Sm-doped CuO. However, the Ti-doped CuO refractive index increased only in the 400 nm to 600 nm range.
In general, this thesis succeeded in uncovering promising properties of the metal doped NiO and CuO nanostructured thin films. |
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Supervisor |
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Dr. Walid Al-Sayed |
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Thesis Type |
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Doctorate Thesis |
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Publishing Year |
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1444 AH
2023 AD |
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Added Date |
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Tuesday, March 7, 2023 |
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Researchers
| دلال سالم بايحي | Bayhi, Dalal Salem | Researcher | Doctorate | |
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